On-Wafer Calibration Techniques: Enabling Accurate Characterization of High-Performance Silicon Devices at the mm-Wave Range and Beyond (1st Edition)

Provides a comprehensive overview of on-wafer calibration techniques for accurate characterization of high-performance silicon devices at mm-wave frequencies and beyond. Covers a wide range of calibration methods, including open, short, load, and through (OSLT), as well as advanced techniques such as multi-line TRL and power-sensor-based calibration. Presents detailed examples and case studies to illustrate the application of these techniques in real-world scenarios. Discusses the limitations and challenges of on-wafer calibration and provides guidance on how to overcome them.* Offers a valuable resource for researchers, engineers, and students working in the field of high-frequency device characterization.